Under constant illumination, single quantum dot is blinking, or fluorescence intermittency. This would greatly limit the application of using single quantum in particle tracking, as well as in lasing technology.…
Professor of Materials Science and Engineering
Professor of Physics and Astronomy
Professor of Chemical and Biomolecular Engineering
Professor of Oncology
Preferred searson@jhu.edu
office (410) 516-8774
lab (410) 516-4748
Institute for NanoBioTechnology
Center of Cancer Nanotechnology Excellence
Office: 120 New Engineering Building
Group office: G30 New Engineering Building
Many important biological processes involve recognition and binding of biomolecules. An example is the lock-and-key binding of antigens and antibodies. Applying the principles of molecular recognition and materials…
Quantum dots are inorganic semiconductor nanoparticles that possess unique optical and electronic properties, which make them suitable for advanced molecular and cellular imaging, drug delivery, and highly sensitive bioassays. …
Capturing the behavior of living cells, especially at the single molecule level, can help elucidate the secrets of human growth, development, and disease. To advance our knowledge of cellular…
The response of cells to chemical and mechanical stimuli is well known and the signaling pathways are reasonably well understood. Cells also respond to electric fields, however, the response…
Endothelial cells form the endothelium that lines the interior of blood vessels. Through transduction of chemical, physical and mechanical signals, the endothelium controls blood flow and regulates a wide…
Proteins found in the membranes of cells facilitate communication between the cell and its environment. One of the main means of communication is by the movement of ions, such as…
Zayats, Maya; Kanwar, Manu; Ostermeier, Marc; Searson, Peter C.; Chemical Communications, 47 3398 (2011)
Zayats, Maya; Kanwar, Manu; Ostermeier, Marc; Searson, Peter C.; Macromolecules, 44 3966 (2011)
Ye, Mao; Searson, Peter C.; Physical Review B, 84 (2011)
Wirtz, Denis; Konstantopoulos, Konstantinos; Searson, Peter C.; Nature Reviews Cancer, 11 512 (2011)
Park, Jeaho; Dvoracek, Charlene; Lee, Kwan Hyi; Galloway, Justin F; Bhang, Hyo-Eun C; Pomper, Martin G; Searson, Peter C; Small (Weinheim an der Bergstrasse, Germany), 7 3148 (2011)
Guo, Lian; Oskam, Gerko; Radisic, Aleksandar; Hoffmann, Peter M.; Searson, Peter C.; Journal of Physics D-Applied Physics, 44 (2011)
Gardner, James M.; Kim, Su; Searson, Peter C.; Meyer, Gerald J.; Journal of Nanomaterials, (2011)
Wildt, B; Wirtz, D; Searson, PC; Nature Protocols, 5 1273 (2010)
O'Brien, B; Sahalov, H; Searson, PC; Applied Physics Letters, 97 (2010)
Mali, P; Wirtz, D; Searson, PC; Biophysical Journal, 99 3526 (2010)
Guo, L; Searson, PC; Electrochimica Acta, 55 4086 (2010)
Guo, L; Searson, PC; Electrochemistry Communications, 12 431 (2010)
Guo, Lian; Thompson, Alexander; Searson, Peter C.; Electrochimica Acta, 55 8416 (2010)
Guo, LA; Searson, PC; Nanoscale, 2 2431 (2010)
Guo, LA; Hung, D; Wang, WG; Shen, WF; Zhu, LY; Chien, CL; Searson, PC; Applied Physics Letters, 97 (2010)
GHALY, T; WILDT, BE; SEARSON, PC; LANGMUIR, 26 1420 (2010)
Lin, J; Szymanski, J; Searson, PC; Hristova, K; Langmuir, 26 3544 (2010)
Lin, JI; Szymanski, J; Searson, PC; Hristova, K; Langmuir, 26 12054 (2010)
Katz, HE; Searson, PC; Poehler, TO; Journal of Materials Research, 25 1561 (2010)
WILDT, B; WIRTZ, D; SEARSON, PC; NATURE METHODS, 6 211 (2009)
LEWANDOWSKI, EP; BERNATE, JA; TSENG, A; SEARSON, PC; STEBE, KJ; SOFT MATTER, 5 886 (2009)
KHATAU, SB; HALE, CM; STEWART-HUTCHINSON, PJ; PATEL, MS; STEWART, CL; SEARSON, PC; HODZIC, D; WIRTZ, D; PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 106 19017 (2009)
GUO, L; ZHANG, SL; SEARSON, P; PHYSICAL REVIEW E, 79 (2009)
Galloway, Justin F.; Park, Jeaho; Lee, Kwan Hyi; Wirtz, Denis; Searson, Peter C.; Science of Advanced Materials, 1 93 (2009)
CELEDON, A; NODELMAN, IM; WILDT, B; DEWAN, R; SEARSON, P; WIRTZ, D; BOWMAN, GD; SUN, SX; NANO LETTERS, 9 1720 (2009)
Li, E; Merzlyakov, M; Lin, J; Searson, P; Hristova, K; Journal of Structural Biology, 168 53 (2009)
PARK, J; LEE, KH; GALLOWAY, JF; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY C, 112 17849 (2008)
O'BRIEN, B; PLAZA, M; ZHU, LY; PEREZ, L; CHIEN, CL; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY C, 112 12018 (2008)
LIU, Z; XIA, GQ; ZHU, FQ; KIM, S; MARKOVIC, N; CHIEN, CL; SEARSON, PC; JOURNAL OF APPLIED PHYSICS, 103 (2008)
LIU, Z; GUO, L; CHIEN, CL; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 155 D569 (2008)
LIU, Z; ELBERT, D; CHIEN, CL; SEARSON, PC; NANO LETTERS, 8 2166 (2008)
LEWANDOWSKI, EP; BERNATE, JA; SEARSON, PC; STEBE, KJ; LANGMUIR, 24 9302 (2008)
GUO, L; SEARSON, PC; LANGMUIR, 24 10557 (2008)
LIN, J; MERZLYAKOV, M; HRISTOVA, K; SEARSON, PC; BIOINTERPHASES, 3 FA33 (2008)
CHANG, WK; WIMLEY, WC; SEARSON, PC; HRISTOVA, K; MERZLYAKOV, M; BIOCHIMICA ET BIOPHYSICA ACTA-BIOMEMBRANES, 1778 2430 (2008)
SHAO, I; CHEN, MW; CAMMARATA, RC; SEARSON, PC; PROKES, SM; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 154 D572 (2007)
SAHALOV, H; O'BRIEN, B; STEBE, KJ; HRISTOVA, K; SEARSON, PC; LANGMUIR, 23 9681 (2007)
O'BRIEN, B; STEBE, KJ; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY C, 111 8686 (2007)
HUNG, D; LIU, Z; SHAH, N; HAO, YW; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY C, 111 3308 (2007)
HAO, Y; ZHU, FQ; CHIEN, CL; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 154 D65 (2007)
GUO, L; SEARSON, PC; ELECTROCHEMICAL AND SOLID STATE LETTERS, 10 D76 (2007)
NIKOLOV, V; LIN, J; MERZLYAKOV, M; HRISTOVA, K; SEARSON, PC; LANGMUIR, 23 13040 (2007)
WILDT, B; MALI, P; SEARSON, PC; LANGMUIR, 22 10528 (2006)
WHALEN, JJ; YOUNG, J; WEILAND, JD; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 153 C834 (2006)
RADISIC, A; VEREECKEN, PM; SEARSON, PC; ROSS, FM; SURFACE SCIENCE, 600 1817 (2006)
RADISIC, A; VEREECKEN, PM; HANNON, JB; SEARSON, PC; ROSS, FM; NANO LETTERS, 6 238 (2006)
RADISIC, A; ROSS, FM; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY B, 110 7862 (2006)
PESIKA, NS; STEBE, KJ; SEARSON, PC; LANGMUIR, 22 3474 (2006)
PESIKA, NS; RADISIC, A; STEBE, KJ; SEARSON, PC; NANO LETTERS, 6 1023 (2006)
NIKOLOV, V; RADISIC, A; HRISTOVA, K; SEARSON, PC; LANGMUIR, 22 7156 (2006)
MALI, P; BHATTACHARJEE, N; SEARSON, PC; NANO LETTERS, 6 1250 (2006)
LONG, JG; SEARSON, PC; VEREECKEN, PM; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 153 C258 (2006)
LIU, Z; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY B, 110 4318 (2006)
LEWANDOWSKI, EP; SEARSON, PC; STEBE, KJ; JOURNAL OF PHYSICAL CHEMISTRY B, 110 4283 (2006)
GUO, L; RADISIC, A; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 153 C840 (2006)
CHEN, M; GUO, L; RAVI, R; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY B, 110 211 (2006)
CHEN, M; CHIEN, CL; SEARSON, PC; CHEMISTRY OF MATERIALS, 18 1595 (2006)
DREWS, TO; ALEKSANDAR, R; ERLEBACHER, J; BRAATZ, RD; SEARSON, PC; ALKIRE, RC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 153 C434 (2006)
WHALEN, JJ; WEILAND, JD; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 152 C738 (2005)
VEREECKEN, PM; RODBELL, K; JI, CX; SEARSON, PC; APPLIED PHYSICS LETTERS, 86 (2005)
SUN, L; SEARSON, PC; CHIEN, CL; PHYSICAL REVIEW B, 71 (2005)
SUN, L; HAO, Y; CHIEN, CL; SEARSON, PC; IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 49 79 (2005)
SALEM, AK; HUNG, CF; KIM, TW; WU, TC; SEARSON, PC; LEONG, KW; NANOTECHNOLOGY, 16 484 (2005)
PESIKA, NS; FAN, FQ; SEARSON, PC; STEBE, KJ; JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 127 11960 (2005)
HU, ZS; SANTOS, JFH; OSKAM, G; SEARSON, PC; JOURNAL OF COLLOID AND INTERFACE SCIENCE, 288 313 (2005)
HU, ZS; RAMIREZ, DJE; CERVERA, BEH; OSKAM, G; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY B, 109 11209 (2005)
GUO, L; RADISIC, A; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY B, 109 24008 (2005)
EAGLETON, TS; MALLET, J; CHENG, XM; WANG, J; CHIEN, CL; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 152 C27 (2005)
CHEN, M; SEARSON, PC; ADVANCED MATERIALS, 17 2765 (2005)
ZHOU, SM; SUN, L; SEARSON, PC; CHIEN, CL; PHYSICAL REVIEW B, 69 (2004)
SUN, L; CHIEN, CL; SEARSON, PC; CHEMISTRY OF MATERIALS, 16 3125 (2004)
SALEM, AK; CHEN, M; HAYDEN, J; LEONG, KW; SEARSON, PC; NANO LETTERS, 4 1163 (2004)
SALEM, AK; CHAO, J; LEONG, KW; SEARSON, PC; ADVANCED MATERIALS, 16 268 (2004)
RADISIC, A; OSKAM, G; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 151 C369 (2004)
MALLET, J; YU-ZHANG, K; CHIEN, CL; EAGLETON, TS; SEARSON, PC; APPLIED PHYSICS LETTERS, 84 3900 (2004)
EAGLETON, TS; SEARSON, PC; CHEMISTRY OF MATERIALS, 16 5027 (2004)
SUN, L; HE, JH; SHENG, HW; SEARSON, PC; CHIEN, CL; MA, E; JOURNAL OF NON-CRYSTALLINE SOLIDS, 317 164 (2003)
VEREECKEN, PM; REN, S; SUN, L; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 150 C131 (2003)
SUN, L; ZHOU, SM; SEARSON, PC; CHIEN, CL; JOURNAL OF APPLIED PHYSICS, 93 6841 (2003)
SHAO, I; VEREECKEN, PM; CHIEN, CL; CAMMARATA, RC; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 150 C184 (2003)
SALEM, AK; SEARSON, PC; LEONG, KW; NATURE MATERIALS, 2 668 (2003)
RADISIC, A; CAO, Y; TAEPHAISITPHONGSE, P; WEST, AC; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 150 C362 (2003)
PESIKA, NS; STEBE, KJ; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY B, 107 10412 (2003)
PESIKA, NS; STEBE, KJ; SEARSON, PC; ADVANCED MATERIALS, 15 1289 (2003)
OSKAM, G; PATEL, PJ; LONG, JG; SEARSON, PC; JOURNAL OF APPLIED PHYSICS, 93 10104 (2003)
OSKAM, G; NELLORE, A; PENN, RL; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY B, 107 1734 (2003)
JI, CX; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY B, 107 4494 (2003)
HU, ZS; OSKAM, G; SEARSON, PC; JOURNAL OF COLLOID AND INTERFACE SCIENCE, 263 454 (2003)
HU, ZS; OSKAM, G; PENN, RL; PESIKA, N; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY B, 107 3124 (2003)
FELTER, TE; MUSKET, RG; MACAULAY, J; CONTOLINI, RJ; SEARSON, PC; NANOSTRUCTURING MATERIALS WITH ENERGETIC BEAMS, 777 121 (2003)
CHEN, M; SUN, L; BONEVICH, JE; REICH, DH; CHIEN, CL; SEARSON, PC; APPLIED PHYSICS LETTERS, 82 3310 (2003)
CHEN, M; SEARSON, PC; CHIEN, CL; JOURNAL OF APPLIED PHYSICS, 93 8253 (2003)
JI, CX; OSKAM, G; DING, Y; ERLEBACHER, JD; WAGNER, AJ; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 150 C523 (2003)
TANASE, M; SILEVITCH, DM; HULTGREN, A; BAUER, LA; SEARSON, PC; MEYER, GJ; REICH, DH; JOURNAL OF APPLIED PHYSICS, 91 8549 (2002)
SHAO, I; VEREECKEN, PM; CHIEN, CL; SEARSON, PC; CAMMARATA, RC; JOURNAL OF MATERIALS RESEARCH, 17 1412 (2002)
SHAO, I; VEREECKEN, PM; CAMMARATA, RC; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 149 C610 (2002)
RADISIC, A; WEST, AC; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 149 C94 (2002)
PESIKA, NS; HU, ZS; STEBE, KJ; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY B, 106 6985 (2002)
OSKAM, G; HU, ZS; PENN, RL; PESIKA, N; SEARSON, PC; PHYSICAL REVIEW E, 66 (2002)
JI, CX; SEARSON, PC; APPLIED PHYSICS LETTERS, 81 4437 (2002)
CHIEN, CL; SUN, L; TANASE, M; BAUER, LA; HULTGREN, A; SILEVITCH, DM; MEYER, GJ; SEARSON, PC; REICH, DH; JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 249 146 (2002)
YANG, FY; STRIJKERS, GJ; HONG, K; REICH, DH; SEARSON, PC; CHIEN, CL; JOURNAL OF APPLIED PHYSICS, 89 7206 (2001)
WONG, EM; HOERTZ, PG; LIANG, CJ; SHI, BM; MEYER, GJ; SEARSON, PC; LANGMUIR, 17 8362 (2001)
VEREECKEN, PM; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 148 C733 (2001)
TANASE, M; BAUER, LA; HULTGREN, A; SILEVITCH, DM; SUN, L; REICH, DH; SEARSON, PC; MEYER, GJ; NANO LETTERS, 1 155 (2001)
SUN, L; SEARSON, PC; CHIEN, CL; APPLIED PHYSICS LETTERS, 79 4429 (2001)
SUN, L; DING, Y; CHIEN, CL; SEARSON, PC; PHYSICAL REVIEW B, 6418 (2001)
STRIJKERS, GJ; YANG, FY; REICH, DH; CHIEN, CL; SEARSON, PC; STRELNIKER, YM; BERGMAN, DJ; IEEE TRANSACTIONS ON MAGNETICS, 37 2067 (2001)
RADISIC, A; LONG, JG; HOFFMANN, PM; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 148 C41 (2001)
PENN, RL; OSKAM, G; STRATHMANN, TJ; SEARSON, PC; STONE, AT; VEBLEN, DR; JOURNAL OF PHYSICAL CHEMISTRY B, 105 2177 (2001)
OSKAM, G; BERGERON, BV; MEYER, GJ; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY B, 105 6867 (2001)
JI, CX; OSKAM, G; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 148 C746 (2001)
JI, CX; OSKAM, G; SEARSON, PC; SURFACE SCIENCE, 492 115 (2001)
CAO, Y; SEARSON, PC; WEST, AC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 148 C376 (2001)
YANG, FY; LIU, K; HONG, KM; REICH, DH; SEARSON, PC; CHIEN, CL; LEPRINCE-WANG, Y; KUI, YZ; HAN, K; PHYSICAL REVIEW B, 61 6631 (2000)
VEREECKEN, PM; SUN, L; SEARSON, PC; TANASE, M; REICH, DH; CHIEN, CL; JOURNAL OF APPLIED PHYSICS, 88 6529 (2000)
VEREECKEN, PM; SHAO, I; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 147 2572 (2000)
SUN, L; SEARSON, PC; CHIEN, CL; PHYSICAL REVIEW B, 61 R6463 (2000)
SUN, L; CHIEN, CL; SEARSON, PC; JOURNAL OF MATERIALS SCIENCE, 35 1097 (2000)
SARKER, H; ONG, I; SARKER, S; SEARSON, PC; POEHLER, TO; SYNTHETIC METALS, 108 33 (2000)
SARKER, H; ONG, IW; SEARSON, PC; POEHLER, TO; SYNTHETIC METALS, 113 151 (2000)
OSKAM, G; SEARSON, PC; COLE, MW; APPLIED PHYSICS LETTERS, 76 1300 (2000)
OSKAM, G; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 147 2199 (2000)
OSKAM, G; SEARSON, PC; SURFACE SCIENCE, 446 103 (2000)
HOFFMANN, PM; VERMEIR, IE; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 147 2999 (2000)
HOFFMANN, PM; RADISIC, A; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 147 2576 (2000)
CHIEN, CL; YANG, FY; LIU, K; REICH, DH; SEARSON, PC; JOURNAL OF APPLIED PHYSICS, 87 4659 (2000)
BUCKLEY, PF; FAGAN, JA; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 147 3456 (2000)
YANG, FY; LIU, K; HONG, KM; REICH, DH; SEARSON, PC; CHIEN, CL; SCIENCE, 284 1335 (1999)
YANG, FY; LIU, K; CHIEN, CL; SEARSON, PC; PHYSICAL REVIEW LETTERS, 82 3328 (1999)
WONG, EM; SEARSON, PC; APPLIED PHYSICS LETTERS, 74 2939 (1999)
WONG, EM; SEARSON, PC; CHEMISTRY OF MATERIALS, 11 1959 (1999)
VEREECKEN, PM; SEARSON, PC; APPLIED PHYSICS LETTERS, 75 3135 (1999)
SUN, L; SEARSON, PC; CHIEN, CL; APPLIED PHYSICS LETTERS, 74 2803 (1999)
SCHLINDWEIN, WS; GOFER, Y; SARKER, H; POEHLER, TO; SEARSON, PC; JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 460 46 (1999)
OSKAM, G; VEREECKEN, PM; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 146 1436 (1999)
OSKAM, G; SEARSON, PC; JOW, TR; ELECTROCHEMICAL AND SOLID STATE LETTERS, 2 610 (1999)
NATARAJAN, A; NELLORE, A; SEARSON, PC; JOURNAL OF APPLIED PHYSICS, 85 1631 (1999)
KILLIAN, JG; GOFER, Y; SARKER, H; POEHLER, TO; SEARSON, PC; CHEMISTRY OF MATERIALS, 11 1075 (1999)
HONG, KM; YANG, FY; LIU, K; REICH, DH; SEARSON, PC; CHIEN, CL; BALAKIREV, FF; BOEBINGER, GS; JOURNAL OF APPLIED PHYSICS, 85 6184 (1999)
HOFFMANN, PM; VERMEIR, IE; NATARAJAN, A; SEARSON, PC; JOURNAL OF APPLIED PHYSICS, 85 1545 (1999)
WONG, EM; BONEVICH, JE; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY B, 102 7770 (1998)
SARKER, H; GOFER, Y; KILLIAN, JG; POEHLER, TO; SEARSON, PC; SYNTHETIC METALS, 97 1 (1998)
OSKAM, G; VAN HEERDEN, D; SEARSON, PC; APPLIED PHYSICS LETTERS, 73 3241 (1998)
OSKAM, G; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY B, 102 2464 (1998)
OSKAM, G; LONG, JG; NATARAJAN, A; SEARSON, PC; JOURNAL OF PHYSICS D-APPLIED PHYSICS, 31 1927 (1998)
NATARAJAN, A; OSKAM, G; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY B, 102 7793 (1998)
NATARAJAN, A; OSKAM, G; SEARSON, PC; JOURNAL OF APPLIED PHYSICS, 83 2112 (1998)
MANN, AB; SEARSON, PC; PETHICA, JB; WEIHS, TP; THIN-FILMS - STRESSES AND MECHANICAL PROPERTIES VII, 505 307 (1998)
LIU, K; CHIEN, CL; SEARSON, PC; KUI, YZ; APPLIED PHYSICS LETTERS, 73 1436 (1998)
LIU, K; CHIEN, CL; SEARSON, PC; KUI, YZ; IEEE TRANSACTIONS ON MAGNETICS, 34 1093 (1998)
LIU, K; CHIEN, CL; SEARSON, PC; PHYSICAL REVIEW B, 58 14681 (1998)
LIU, KI; CHIEN, CL; SEARSON, PC; YU-ZHANG, K; APPLIED PHYSICS LETTERS, 73 2222 (1998)
HOFFMANN, PM; OSKAM, G; SEARSON, PC; JOURNAL OF APPLIED PHYSICS, 83 4309 (1998)
GOFER, Y; KILLIAN, JG; SARKER, H; POEHLER, TO; SEARSON, PC; JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 443 103 (1998)
SARKER, H; GOFER, Y; KILLIAN, JG; POEHLER, TO; SEARSON, PC; SYNTHETIC METALS, 88 179 (1997)
ROSS, FM; OSKAM, G; SEARSON, PC; MACAULAY, JM; LIDDLE, JA; PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 75 525 (1997)
OSKAM, G; NATARAJAN, A; SEARSON, PC; ROSS, FM; APPLIED SURFACE SCIENCE, 119 160 (1997)
NIKOLOVA, MS; NATARAJAN, A; SEARSON, PC; CHAKAROVA, GS; MACAULAY, JM; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 144 455 (1997)
GOFER, Y; SARKER, H; KILLIAN, JG; POEHLER, TO; SEARSON, PC; APPLIED PHYSICS LETTERS, 71 3447 (1997)
GOFER, Y; SARKER, H; KILLIAN, JG; POEHLER, TO; SEARSON, PC; APPLIED PHYSICS LETTERS, 71 1582 (1997)
OSKAM, G; SCHMIDT, JC; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 143 2538 (1996)
OSKAM, G; SCHMIDT, JC; HOFFMANN, PM; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 143 2531 (1996)
OSKAM, G; HOFFMANN, PM; SEARSON, PC; PHYSICAL REVIEW LETTERS, 76 1521 (1996)
OSKAM, G; HOFFMANN, PM; SCHMIDT, JC; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY, 100 1801 (1996)
KILLIAN, JG; COFFEY, BM; GAO, F; POEHLER, TO; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 143 936 (1996)
CAO, F; OSKAM, G; MEYER, GJ; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY, 100 17021 (1996)
SEARSON, PC; LI, R; SIERADZKI, K; PHYSICAL REVIEW LETTERS, 74 1395 (1995)
SEARSON, PC; CAMMARATA, RC; CHIEN, CL; JOURNAL OF ELECTRONIC MATERIALS, 24 955 (1995)
ROSS, FM; SEARSON, PC; MICROSCOPY OF SEMICONDUCTING MATERIALS 1995, 146 511 (1995)
OBERLE, RR; SCANLON, MR; CAMMARATA, RC; SEARSON, PC; APPLIED PHYSICS LETTERS, 66 19 (1995)
LIU, K; NAGODAWITHANA, K; SEARSON, PC; CHIEN, CL; PHYSICAL REVIEW B, 51 7381 (1995)
COFFEY, B; MADSEN, PV; POEHLER, TO; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 142 321 (1995)
CAO, F; OSKAM, G; SEARSON, PC; STIPKALA, JM; HEIMER, TA; FARZAD, F; MEYER, GJ; JOURNAL OF PHYSICAL CHEMISTRY, 99 11974 (1995)
CAO, F; OSKAM, G; SEARSON, PC; JOURNAL OF PHYSICAL CHEMISTRY, 99 17071 (1995)
VANMAEKELBERGH, D; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 141 697 (1994)
ERLEBACHER, J; SIERADZKI, K; SEARSON, PC; JOURNAL OF APPLIED PHYSICS, 76 182 (1994)
WHITNEY, TM; JIANG, JS; SEARSON, PC; CHIEN, CL; SCIENCE, 261 1316 (1993)
SEARSON, PC; PROKES, SM; GLEMBOCKI, OJ; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 140 3327 (1993)
SEARSON, PC; MACDONALD, DD; ELECTROCHIMICA ACTA, 38 1913 (1993)
FERNANDES, MG; LATANISION, RM; SEARSON, PC; PHYSICAL REVIEW B, 47 11749 (1993)
ERLEBACHER, J; SEARSON, PC; SIERADZKI, K; PHYSICAL REVIEW LETTERS, 71 3311 (1993)
SEARSON, PC; MACDONALD, DD; PETER, LM; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 139 2538 (1992)
SEARSON, PC; MACAULAY, JM; ROSS, FM; JOURNAL OF APPLIED PHYSICS, 72 253 (1992)
SEARSON, PC; MACAULAY, JM; PROKES, SM; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 139 3373 (1992)
SEARSON, PC; SOLAR ENERGY MATERIALS AND SOLAR CELLS, 27 377 (1992)
PROKES, SM; GLEMBOCKI, OJ; BERMUDEZ, VM; KAPLAN, R; FRIEDERSDORF, LE; SEARSON, PC; PHYSICAL REVIEW B, 45 13788 (1992)
PROKES, SM; FREITAS, JA; SEARSON, PC; APPLIED PHYSICS LETTERS, 60 3295 (1992)
FRIEDERSDORF, LE; SEARSON, PC; PROKES, SM; GLEMBOCKI, OJ; MACAULAY, JM; APPLIED PHYSICS LETTERS, 60 2285 (1992)
SEARSON, PC; ZHANG, XG; ELECTROCHIMICA ACTA, 36 499 (1991)
SEARSON, PC; APPLIED PHYSICS LETTERS, 59 832 (1991)
SEARSON, PC; ACTA METALLURGICA ET MATERIALIA, 39 2519 (1991)
NAGARKAR, PV; SEARSON, PC; GEALY, FD; JOURNAL OF APPLIED PHYSICS, 69 459 (1991)
DRORY, MD; SEARSON, PC; LIU, L; JOURNAL OF MATERIALS SCIENCE LETTERS, 10 81 (1991)
SEARSON, PC; ZHANG, XG; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 137 2539 (1990)
SEARSON, PC; LATANISION, RM; ELECTROCHIMICA ACTA, 35 445 (1990)
FORD, TE; SEARSON, PC; HARRIS, T; MITCHELL, R; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 137 1175 (1990)
SEARSON, PC; NAGARKAR, PV; LATANISION, RM; INTERNATIONAL JOURNAL OF HYDROGEN ENERGY, 14 131 (1989)
SEARSON, PC; LATANISION, RM; STIMMING, U; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 135 1358 (1988)
SEARSON, PC; DAWSON, JL; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 135 1908 (1988)
SEARSON, PC; LATANISION, RM; CORROSION, 42 161 (1986)
SAITO, N; SEARSON, PC; LATANISION, RM; CORROSION SCIENCE, 26 629 (1986)
BELLINGHAM, JG; MACVICAR, MLA; NISENOFF, M; SEARSON, PC; JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 133 1753 (1986)
SEARSON, PC; LATANISION, RM; CORROSION SCIENCE, 25 947 (1985)
JOHN, DG; SEARSON, PC; DAWSON, JL; BRITISH CORROSION JOURNAL, 16 102 (1981)